MIL-PRF-32516 – Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical)

This specification covers the minimum performance requirements for equipment to_x000D_
detect and isolate nanosecond, microsecond, and millisecond intermittent faults (see 6.5.10), which_x000D_
can occur in conductive paths (see 6.5.2). Conductive paths include Line Replaceable Unit_x000D_
(LRU)/Weapon Replaceable Assembly (WRA) (see 6.5.12 and 6.5.19) chassis and backplane_x000D_
circuits and their wire harnesses; weapon system Electrical Wiring Interconnect System (EWIS)_x000D_
(see 6.5.4 and 6.5.20); and patch cables, electronic test cables and their connectors. This_x000D_
specification is not intended to address hard opens (see 6.5.14), shorts (see 6.5.16), nor constant_x000D_
function failures found in routine electronics repair.

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