List of Electronics Standards

• ASTM F1761 – Standard Test Method for Pass Through Flux of Circular Magnetic Sputtering Targets (Withdrawn 2020)
• ASTM F1762 – Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch
• ASTM F1709 – Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
• ASTM F1710 – Standard Test Method for Trace Metallic Impurities in Electronic Grade Titanium by High Mass-Resolution Glow Discharge Mass Spectrometer
• ASTM F1711 – Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
• ASTM F1689 – Standard Test Method for Determining the Insulation Resistance of a Membrane Switch
• ASTM F1680 – Standard Test Method for Determining Circuit Resistance of a Membrane Switch
• ASTM F1681 – Standard Test Method for Determining Current Carrying Capacity of a Membrane Switch Circuit
• ASTM F1682 – Standard Test Method for Determining Travel of a Membrane Switch (Withdrawn 2008)
• ASTM F1683 – Standard Practice for Creasing or Bending a Membrane Switch, Membrane Switch Flex Tail Assembly or Membrane Switch Component (Withdrawn 2018)
• ASTM F1684 – Standard Specification for Iron-Nickel and Iron-Nickel-Cobalt Alloys for Low Thermal Expansion Applications
• ASTM F1661 – Standard Test Method for Determining the Contact Bounce Time of a Membrane Switch
• ASTM F1662 – Standard Test Method for Verifying the Specified Dielectric Withstand Voltage and Determining the Dielectric Breakdown Voltage of a Membrane Switch or Printed Electronic Device
• ASTM F1663 – Standard Test Method for Determining the Capacitance of a Membrane Switch or Printed Electronic Device
• ASTM F16 – Standard Test Methods for Measuring Diameter or Thickness of Wire and Ribbon for Electronic Devices and Lamps
• ASTM F1593 – Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum by High Mass-Resolution Glow-Discharge Mass Spectrometer
• ASTM F1594 – Standard Specification for Pure Aluminum (Unalloyed) Source Material for Vacuum Coating Applications (Withdrawn 2020)
• ASTM F1595 – Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
• ASTM F1596 – Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
• ASTM F1597 – Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch (Withdrawn 2008)
• ASTM F1598 – Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
• ASTM F1578 – Standard Test Method for Contact Closure Cycling of a Membrane Switch
• ASTM F1570 – Standard Test Method for Determining the Tactile Ratio of a Membrane Switch (Withdrawn 2007)
• ASTM F1512 – Standard Practice for Ultrasonic C-Scan Bond Evaluation of Sputtering Target-Backing Plate Assemblies (Withdrawn 2020)
• ASTM F1513 – Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
• ASTM F1467 – Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
• ASTM F1438 – Standard Test Method for Determination of Surface Roughness by Scanning Tunneling Microscopy for Gas Distribution System Components
• ASTM F1466 – Standard Specification for Iron-Nickel-Cobalt Alloys for Metal-to-Ceramic Sealing Applications
• ASTM F1394 – Standard Test Method for Determination of Particle Contribution from Gas Distribution System Valves
• ASTM F1396 – Standard Test Method for Determination of Oxygen Contribution by Gas Distribution System Components
• ASTM F1397 – Standard Test Method for Determination of Moisture Contribution by Gas Distribution System Components
• ASTM F1398 – Standard Test Method for Determination of Total Hydrocarbon Contribution by Gas Distribution System Components
• ASTM F1404 – Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
• ASTM F1373 – Standard Test Method for Determination of Cycle Life of Automatic Valves for Gas Distribution System Components
• ASTM F1374 – Standard Test Method for Ionic/Organic Extractables of Internal Surfaces-IC/GC/FTIR for Gas Distribution System Components
• ASTM F1375 – Standard Test Method for Energy Dispersive X-Ray Spectrometer (EDX) Analysis of Metallic Surface Condition for Gas Distribution System Components
• ASTM F1376 – Standard Guide for Metallurgical Analysis for Gas Distribution System Components
• ASTM F1367 – Standard Specification for Chromium Sputtering Targets for Thin Film Applications (Withdrawn 2020)
• ASTM F1372 – Standard Test Method for Scanning Electron Microscope (SEM) Analysis of Metallic Surface Condition for Gas Distribution System Components
• ASTM F1269 – Standard Test Methods for Destructive Shear Testing of Ball Bonds
• ASTM F1259M – Standard Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration [Metric] (Withdrawn 2009)
• ASTM F1260M – Standard Test Method for Estimating Electromigration Median Time-to-Failure and Sigma of Integrated Circuit Metallizations [Metric] (Withdrawn 2009)
• ASTM F1261M – Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric] (Withdrawn 2009)
• ASTM F1262M – Standard Guide for Transient Radiation Upset Threshold Testing of Digital Integrated Circuits (Metric)
• ASTM F1263 – Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
• ASTM F1212 – Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)
• ASTM F1238 – Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications (Withdrawn 2020)
• ASTM F1190 – Standard Guide for Neutron Irradiation of Unbiased Electronic Components
• ASTM F1192 – Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
• ASTM F111 – Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters (Withdrawn 2008)
• ASTM F1094 – Standard Test Methods for Microbiological Monitoring of Water Used for Processing Electron and Microelectronic Devices by Direct Pressure Tap Sampling Valve and by the Presterilized Plastic Bag Method
• ASTM F106 – Standard Specification for Brazing Filler Metals for Electron Devices
• ASTM F1 – Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes (Withdrawn 2009)

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