{"id":235156,"date":"2023-03-08T05:30:28","date_gmt":"2023-03-07T20:30:28","guid":{"rendered":"https:\/\/kikakumaster.com\/iso\/iec-tr-63258\/"},"modified":"2023-03-08T05:30:28","modified_gmt":"2023-03-07T20:30:28","slug":"iec-tr-63258","status":"publish","type":"iso","link":"https:\/\/kikakumaster.com\/ja\/iso\/iec-tr-63258\/","title":{"rendered":"IEC\/TR 63258 – Nanotechnologies \u2014 A guideline for ellipsometry application to evaluate the thickness of nanoscale films"},"content":{"rendered":"

IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.<\/p>

\"American<\/a><\/p>\n<\/div>\n

Go to IEC\/TR 63258 at ISO.org<\/a><\/p>\n","protected":false},"excerpt":{"rendered":"

IEC\/TR 63258 – Nanotechnologies \u2014 A guideline for ellipsometry application to evaluate the thickness of nanoscale films – IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. This document does not include any specification of the ellipsometers, but suggests how to minimize the data variation to improve data reproducibility.<\/p>\n","protected":false},"featured_media":0,"comment_status":"open","ping_status":"open","template":"","categories":[170,1],"tags":[],"sdo":[165],"topic":[],"fsc":[],"ics":[],"class_list":["post-235156","iso","type-iso","status-publish","hentry","category-iso","category-standards","sdo-iso"],"acf":[],"yoast_head":"\nIEC\/TR 63258 - Nanotechnologies \u2014 A guideline for ellipsometry application to evaluate the thickness of nanoscale films - \u898f\u683c\u30de\u30b9\u30bf\u30fc<\/title>\n<meta name=\"description\" content=\"Nanotechnologies \u2014 A guideline for ellipsometry application to evaluate the thickness of nanoscale films - IEC TR 63258:2021 is a Technical Report focused on the practical protocol of ellipsometry to evaluate the thickness of nanoscale films. 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