{"version":"1.0","provider_name":"\u898f\u683c\u30de\u30b9\u30bf\u30fc","provider_url":"https:\/\/kikakumaster.com\/ja\/","author_name":"KikakuAdmin000","author_url":"https:\/\/kikakumaster.com\/ja\/author\/kikakuadmin000\/","title":"MIL-PRF-32516 - Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical) - \u898f\u683c\u30de\u30b9\u30bf\u30fc","type":"rich","width":600,"height":338,"html":"<blockquote class=\"wp-embedded-content\" data-secret=\"UV8fJmdQbp\"><a href=\"https:\/\/kikakumaster.com\/ja\/mil-spec\/mil-prf-32516\/\">MIL-PRF-32516 &#8211; Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical)<\/a><\/blockquote><iframe sandbox=\"allow-scripts\" security=\"restricted\" src=\"https:\/\/kikakumaster.com\/ja\/mil-spec\/mil-prf-32516\/embed\/#?secret=UV8fJmdQbp\" width=\"600\" height=\"338\" title=\"&#8220;MIL-PRF-32516 &#8211; Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical)&#8221; &#8212; \u898f\u683c\u30de\u30b9\u30bf\u30fc\" data-secret=\"UV8fJmdQbp\" frameborder=\"0\" marginwidth=\"0\" marginheight=\"0\" scrolling=\"no\" class=\"wp-embedded-content\"><\/iframe><script type=\"text\/javascript\">\n\/* <![CDATA[ *\/\n\/*! This file is auto-generated *\/\n!function(d,l){\"use strict\";l.querySelector&&d.addEventListener&&\"undefined\"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!\/[^a-zA-Z0-9]\/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret=\"'+t.secret+'\"]'),o=l.querySelectorAll('blockquote[data-secret=\"'+t.secret+'\"]'),c=new RegExp(\"^https?:$\",\"i\"),i=0;i<o.length;i++)o[i].style.display=\"none\";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute(\"style\"),\"height\"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):\"link\"===t.message&&(r=new URL(s.getAttribute(\"src\")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener(\"message\",d.wp.receiveEmbedMessage,!1),l.addEventListener(\"DOMContentLoaded\",function(){for(var e,t,s=l.querySelectorAll(\"iframe.wp-embedded-content\"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute(\"data-secret\"))||(t=Math.random().toString(36).substring(2,12),e.src+=\"#?secret=\"+t,e.setAttribute(\"data-secret\",t)),e.contentWindow.postMessage({message:\"ready\",secret:t},\"*\")},!1)))}(window,document);\n\/\/# sourceURL=https:\/\/kikakumaster.com\/wp-includes\/js\/wp-embed.min.js\n\/* ]]> *\/\n<\/script>\n","description":"Electronic Test Equipment, Intermittent Fault Diagnostic (Electrical) - This specification covers the minimum performance requirements for equipment to_x000D_ detect and isolate nanosecond, microsecond, and millisecond intermittent faults (see 6.5.10), which_x000D_ can occur in conductive paths (see 6.5.2). Conductive paths include Line Replaceable Unit_x000D_ (LRU)\/Weapon Replaceable Assembly (WRA) (see 6.5.12 and 6.5.19) chassis and backplane_x000D_ circuits and their wire harnesses; weapon system Electrical Wiring Interconnect System (EWIS)_x000D_ (see 6.5.4 and 6.5.20); and patch cables, electronic test cables and their connectors. This_x000D_ specification is not intended to address hard opens (see 6.5.14), shorts (see 6.5.16), nor constant_x000D_ function failures found in routine electronics repair."}