1.0規格マスターhttps://kikakumaster.com/ja/KikakuAdmin000https://kikakumaster.com/ja/author/kikakuadmin000/rich600338<blockquote class="wp-embedded-content" data-secret="hsrIDM24Ty"><a href="https://kikakumaster.com/ja/mil-spec/eia469/">EIA469 – Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors</a></blockquote><iframe sandbox="allow-scripts" security="restricted" src="https://kikakumaster.com/ja/mil-spec/eia469/embed/#?secret=hsrIDM24Ty" width="600" height="338" title="“EIA469 – Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors” — 規格マスター" data-secret="hsrIDM24Ty" frameborder="0" marginwidth="0" marginheight="0" scrolling="no" class="wp-embedded-content"></iframe><script type="text/javascript"> /* <![CDATA[ */ /*! This file is auto-generated */ !function(d,l){"use strict";l.querySelector&&d.addEventListener&&"undefined"!=typeof URL&&(d.wp=d.wp||{},d.wp.receiveEmbedMessage||(d.wp.receiveEmbedMessage=function(e){var t=e.data;if((t||t.secret||t.message||t.value)&&!/[^a-zA-Z0-9]/.test(t.secret)){for(var s,r,n,a=l.querySelectorAll('iframe[data-secret="'+t.secret+'"]'),o=l.querySelectorAll('blockquote[data-secret="'+t.secret+'"]'),c=new RegExp("^https?:$","i"),i=0;i<o.length;i++)o[i].style.display="none";for(i=0;i<a.length;i++)s=a[i],e.source===s.contentWindow&&(s.removeAttribute("style"),"height"===t.message?(1e3<(r=parseInt(t.value,10))?r=1e3:~~r<200&&(r=200),s.height=r):"link"===t.message&&(r=new URL(s.getAttribute("src")),n=new URL(t.value),c.test(n.protocol))&&n.host===r.host&&l.activeElement===s&&(d.top.location.href=t.value))}},d.addEventListener("message",d.wp.receiveEmbedMessage,!1),l.addEventListener("DOMContentLoaded",function(){for(var e,t,s=l.querySelectorAll("iframe.wp-embedded-content"),r=0;r<s.length;r++)(t=(e=s[r]).getAttribute("data-secret"))||(t=Math.random().toString(36).substring(2,12),e.src+="#?secret="+t,e.setAttribute("data-secret",t)),e.contentWindow.postMessage({message:"ready",secret:t},"*")},!1)))}(window,document); //# sourceURL=https://kikakumaster.com/wp-includes/js/wp-embed.min.js /* ]]> */ </script> Standard Test Method for Destructive Physical Analysis (DPA) of Ceramic Monolithic Capacitors - This document provides terminology, suggested methods, and criteria for characterizing the internal structural features of monolithic, ceramic dielectric capacitors. Its major objective is the accurate evaluation of the internal physical quality of the chip capacitor element as it relates to the functional reliability of the finished capacitor. This Standard also provides needed and useful information pertaining to activities associated with destructive physical analysis (DPA), such as visual inspection and DPA reporting. In addition, it provides tutorial help for problems inherent in DPA sample processing